Products

Probe Systems

Analytical wafer probe systems for DC, RF, optical, high-power, thermal, and cryogenic device characterization.

HomeProbe Systems

System Platforms

Modular systems for engineering labs and production-adjacent characterization.

WG-150 Atlas

Compact 150 mm analytical station for universities, startups, and process-development labs.

WG-200 Vector

Semi-automatic 200 mm system with recipe-driven probing and thermal chuck options.

WG-300 Meridian

300 mm automated wafer probe platform for advanced process nodes and volume engineering.

Autonomous Assistants

Vision alignment, contact optimization, wafer-map execution, and guided maintenance workflows.

Built for Repeatability

Each system is configured around the measurement problem rather than a generic frame size. WaferGrid Technologies Pte Ltd applications engineers specify probe positioners, chucks, microscope optics, enclosures, and calibration accessories together.

Sub-micron motion options for demanding RF and photonic test.
Thermal chuck range from -60 C to 300 C with upgrade paths.
Optional shielded and low-noise environments for sensitive measurements.