WaferGrid Technologies Pte Ltd | Semiconductor Test & Measurement
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Automotive

Wafer test technologies for automotive radar, power management, compute, sensors, and safety-critical electronics.

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Designed for Reliability Pressure

Automotive electronics require confidence across temperature, voltage, lifetime, and process variation.

  • High-temperature probe-card options.
  • SiC and GaN wafer probing for power devices.
  • RF radar device support with stable, repeatable contact.